Hardware and software for scanning probe microscopy
Metrology scanning probe microscope
Metrology scanning probe microscope is a system used for traceability
transfer from lasers (primary length standards) to micro- and nanoscale.
It is based on a specialized home-build SPM using Physik Instrumente three-axis
table (as a scanner), simple AFM head using Atmel microcontroller as a digital
signal processor, six axis interferometric system for monitoring sample movement
and thermally protecting chamber.
Metrology scanning probe microscope is described in the following article:
J. Lazar, P. Klapetek, O. Èíp, M. ÈíŸek, M. ©erý,
Local probe microscopy with interferometric monitoring of the stage nanopositioning
Meas. Sci. Technol., 20, 084007
Statistical analysis of AFM data
During my university studies I focused on statistical analysis of AFM data, in particular
connected with randomly rough surfaces. This means evaluating statistical functions
and parameters (correlation functions, height and angular distributions, fractal properties),
and grain analysis (grain segmentation, meand grain size and geometry).
Some procedures and their results can be found in my publications.
Extensive overview is also in my PhD thesis.
Most of the statistical analysis methods form parts of the Gwyddion